• DocumentCode
    386654
  • Title

    Test bench for investigation of awkward shaped signals influence on radioelectronic equipment

  • Author

    Bolotov, V.N. ; Tkach, Yu.V.

  • Author_Institution
    Inst. for Electromagn. Res., Kharkov, Ukraine
  • fYear
    2002
  • fDate
    9-13 Sept. 2002
  • Firstpage
    496
  • Lastpage
    499
  • Abstract
    Studies of electronic equipment resistance to external electromagnetic interference has become an urgent problem due to many reasons. One of the most important reasons is the permanently complicated electromagnetic compatibility, caused by the increasing number of receiver-transmitter devices operating in the microwave band. To study the formation of chaotic states in electronic equipment, when affected by a complex sequence of short microwave pulses with variable pulse-to-pulse length, a specialized stand was developed.
  • Keywords
    chaos generators; circuit stability; electromagnetic compatibility; electromagnetic interference; electronic equipment testing; microwave generation; microwave measurement; test equipment; 2 to 8.8 GHz; EMC; circuit stability; electromagnetic compatibility; electromagnetic interference; electronic equipment EMI resistance; electronic equipment chaotic states; microwave band receiver-transmitter devices; radioelectronic equipment awkward shaped signal influence; variable pulse-to-pulse length microwave pulses; Broadband antennas; Dipole antennas; Directive antennas; Pulse generation; Pulse modulation; Radiation detectors; Receiving antennas; Signal generators; Signal processing; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Telecommunication Technology, 2002. CriMiCo 2002. 12th International Conference
  • Print_ISBN
    966-7968-12-X
  • Type

    conf

  • DOI
    10.1109/CRMICO.2002.1137330
  • Filename
    1137330