DocumentCode
386654
Title
Test bench for investigation of awkward shaped signals influence on radioelectronic equipment
Author
Bolotov, V.N. ; Tkach, Yu.V.
Author_Institution
Inst. for Electromagn. Res., Kharkov, Ukraine
fYear
2002
fDate
9-13 Sept. 2002
Firstpage
496
Lastpage
499
Abstract
Studies of electronic equipment resistance to external electromagnetic interference has become an urgent problem due to many reasons. One of the most important reasons is the permanently complicated electromagnetic compatibility, caused by the increasing number of receiver-transmitter devices operating in the microwave band. To study the formation of chaotic states in electronic equipment, when affected by a complex sequence of short microwave pulses with variable pulse-to-pulse length, a specialized stand was developed.
Keywords
chaos generators; circuit stability; electromagnetic compatibility; electromagnetic interference; electronic equipment testing; microwave generation; microwave measurement; test equipment; 2 to 8.8 GHz; EMC; circuit stability; electromagnetic compatibility; electromagnetic interference; electronic equipment EMI resistance; electronic equipment chaotic states; microwave band receiver-transmitter devices; radioelectronic equipment awkward shaped signal influence; variable pulse-to-pulse length microwave pulses; Broadband antennas; Dipole antennas; Directive antennas; Pulse generation; Pulse modulation; Radiation detectors; Receiving antennas; Signal generators; Signal processing; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology, 2002. CriMiCo 2002. 12th International Conference
Print_ISBN
966-7968-12-X
Type
conf
DOI
10.1109/CRMICO.2002.1137330
Filename
1137330
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