Title :
Reliability of military electronic equipment and our ability to maintain it for war
Author_Institution :
Stanford Research Institute, Stanford, CA, USA
Keywords :
Airplanes; Circuit faults; Electric shock; Electronic equipment; Job design; Maintenance engineering; Military aircraft; Military equipment; Reliability engineering; Weapons;
Conference_Titel :
1958 IRE International Convention Record
Conference_Location :
New York, NY, USA
DOI :
10.1109/IRECON.1953.1148700
