Title :
Future trends in radomes for ground electronic equipment
Author_Institution :
Rome Air Development Center, New York, NY, USA
Keywords :
Dielectric materials; Electronic equipment; Intrusion detection; Laboratories; Materials testing; Microwave theory and techniques; Plastic films; Propagation losses; Radio frequency; Thin wall structures;
Conference_Titel :
1958 IRE International Convention Record
Conference_Location :
New York, NY, USA
DOI :
10.1109/IRECON.1956.1150468
