DocumentCode
387038
Title
Submicron technology: Why, when and how
Author
Anderson, Lindsay
Author_Institution
Bell Laboratories, Allentown, PA, USA
Volume
XVIII
fYear
1975
fDate
27426
Firstpage
72
Lastpage
72
Abstract
There has been a historical trend to reduce feature sizes in solid-state devices and circuits to improve performance and achieve higher packing density. The fundamental limits and practical problems associated with smaller features will be examined, citing the impact of emerging pattern generation technologies, such as electron-beam and x-ray lithography, on circuits with features below 1 μm.
Keywords
Acoustic waves; Costs; Large scale integration; Magnetic circuits; Magnetic devices; Optical devices; Optical surface waves; Silicon; Solid state circuits; Surface acoustic wave devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
Type
conf
DOI
10.1109/ISSCC.1975.1155415
Filename
1155415
Link To Document