• DocumentCode
    387038
  • Title

    Submicron technology: Why, when and how

  • Author

    Anderson, Lindsay

  • Author_Institution
    Bell Laboratories, Allentown, PA, USA
  • Volume
    XVIII
  • fYear
    1975
  • fDate
    27426
  • Firstpage
    72
  • Lastpage
    72
  • Abstract
    There has been a historical trend to reduce feature sizes in solid-state devices and circuits to improve performance and achieve higher packing density. The fundamental limits and practical problems associated with smaller features will be examined, citing the impact of emerging pattern generation technologies, such as electron-beam and x-ray lithography, on circuits with features below 1 μm.
  • Keywords
    Acoustic waves; Costs; Large scale integration; Magnetic circuits; Magnetic devices; Optical devices; Optical surface waves; Silicon; Solid state circuits; Surface acoustic wave devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
  • Type

    conf

  • DOI
    10.1109/ISSCC.1975.1155415
  • Filename
    1155415