DocumentCode
387055
Title
A modular design and test approach for a family of VLSI MPUs
Author
Braune, D. ; Guerin, Alexandre ; Lebrousse, J.
Author_Institution
International Microelectronic Support Center, Fontenay Aux Roses, France
Volume
XXX
fYear
1987
fDate
0-0 Feb. 1987
Firstpage
90
Lastpage
91
Abstract
Processors based on a commercial CPU integrated with supporting modules will be described. A handcrafted optimization of the core and semi-custom design of the on-chip modules will be detailed.
Keywords
Assembly; Automatic control; Circuit testing; Design methodology; Design optimization; Integrated circuit testing; Silicon; Test pattern generators; Time factors; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1987 IEEE International
Conference_Location
New York, NY, USA
Type
conf
DOI
10.1109/ISSCC.1987.1157227
Filename
1157227
Link To Document