• DocumentCode
    38710
  • Title

    Impedance Perturbation Theory for Coupled Uniform Transmission Lines

  • Author

    Gen Yin ; Xiao-Ding Cai ; Secker, David ; Ortiz, Matt ; Cline, Julia ; Vaidyanath, Arun

  • Author_Institution
    Rambus Corp., Sunnyvale, CA, USA
  • Volume
    57
  • Issue
    2
  • fYear
    2015
  • fDate
    Apr-15
  • Firstpage
    299
  • Lastpage
    308
  • Abstract
    Taking the impedance mismatch of transmission lines as a small quantity, a novel impedance perturbation theory based on the lumped transmission line model is established for both the single-ended and coupled transmission lines. The propagation constant, S-parameters, and T-parameters can be directly constructed from an impedance perturbation factor. As an application example, a detailed perturbation analysis is carried out for differential striplines, which provides insights in the S-parameter features and the splitting in the modal propagation constants. The corresponding numerical simulation indicates that the perturbation model captures and explains the most important features of the exact S-parameters. As another application example, the perturbation model is employed in the through-reflection-line deembedding formulas to evaluate the measurement accuracy and sensitivity. The trends obtained by this analysis is later confirmed by experimental results.
  • Keywords
    S-parameters; coupled transmission lines; impedance matching; numerical analysis; perturbation theory; telecommunication transmission lines; S-parameter features; T-parameter features; coupled uniform transmission line impedance mismatch; differential striplines; impedance perturbation theory; lumped transmission line model; numerical simulation; propagation constant; single-ended transmission lines; through-reflection-line deembedding formula; Impedance; Numerical models; Power transmission lines; Propagation constant; Scattering parameters; Stripline; Transmission line matrix methods; Differential transmission lines; RLGC; impedance perturbation; through-reflection-line (TRL) deembedding; transmission line theory;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2014.2377050
  • Filename
    7024115