Comprehensive frequency-dependent substrate noise analysis using boundary element methods

Author

Li, Hengmei ; Carballido, Jorge ; Yu, Harry H. ; Okhmatovski, Vladimir L. ; Rosenbaum, Elyse ; Cangellaris, Andreas C.

Author_Institution

Illinois Univ., Urbana, IL, USA

fYear

2002

fDate

10-14 Nov. 2002

Firstpage

2

Lastpage

9

Abstract

We present a comprehensive methodology for the electrodynamic modeling of substrate noise coupling. A new and efficient method is introduced for the calculation of the Green´s function that can accommodate arbitrary substrate doping profiles and thus facilitate substrate noise analysis using boundary element methods. In addition to a discussion of the application of the method and its validation in the context of substrate transfer resistance extraction, preliminary results from its application to frequency-dependent substrate noise modeling are also presented.

Keywords

Green´s function methods; boundary-elements methods; circuit layout CAD; doping profiles; electric resistance; integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; integrated circuit noise; Green´s function; boundary element methods; electrodynamic modeling; frequency-dependent substrate noise analysis; modeling; substrate doping profiles; substrate transfer resistance extraction; Boundary element methods; Circuit noise; Circuit simulation; Costs; Coupling circuits; Doping profiles; Frequency; Impedance; Semiconductor process modeling; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on

ISSN

1092-3152

Print_ISBN

0-7803-7607-2

Type

conf

DOI

10.1109/ICCAD.2002.1167506

Filename

1167506