Title :
A delay metric for RC circuits based on the Weibull distribution
Author :
Liu, F. ; Kashyap, C. ; Alpert, C.J.
Author_Institution :
IBM Austin, TX, USA
Abstract :
Physical design optimizations such as placement, interconnect synthesis, floorplanning, and routing require fast and accurate analysis of RC networks. Because of its simple close form and fast evaluation, the Elmore delay metric has been widely adopted. The recently proposed delay metrics PRIMO and H-gamma match the first three circuit moments to the probability density function of a gamma statistical distribution. Although these methods demonstrate impressive accuracy compared to other delay metrics, their implementations tend to be challenging. As an alternative to matching to the gamma distribution, we propose to match the first two circuit moments to a Weibull distribution. The result is a new delay metric called Weibull based Delay (WED). The primary advantages of WED over PRIMO and H-gamma are its efficiency and ease of implementation. Experiments show that WED is robust and has satisfactory accuracies at both near- and far-end nodes.
Keywords :
RC circuits; Weibull distribution; circuit layout CAD; delay estimation; integrated circuit layout; network routing; RC networks; Weibull based delay metric; Weibull distribution; circuit moments; design optimizations; floorplanning; interconnect synthesis; placement; probability density function; probability moments; routing; Circuit synthesis; Delay; Design optimization; Integrated circuit interconnections; Network synthesis; Probability density function; Robustness; Routing; Statistical distributions; Weibull distribution;
Conference_Titel :
Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-7607-2
DOI :
10.1109/ICCAD.2002.1167597