DocumentCode
38790
Title
Effective Method for Simultaneous Gate Sizing and
th Assignment Using Lagrangian Relaxation
Author
Flach, Guilherme ; Reimann, Tiago ; Posser, Gracieli ; Johann, Marcelo ; Reis, R.
Author_Institution
PGMicro/PPGC, Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
Volume
33
Issue
4
fYear
2014
fDate
Apr-14
Firstpage
546
Lastpage
557
Abstract
This paper presents a fast and effective approach to gate-version selection and threshold voltage, Vth, assignment. In the proposed flow, first, a solution without slew and load violation is generated. Then, a Lagrangian Relaxation (LR) method is used to reduce leakage power and achieve timing closure while keeping the circuit no or few violations. If the set of gate-versions given by LR produces a circuit with negative slack, a timing recovery method is applied to find near zero positive slack. The solution without negative slack is finally introduced to a power reduction step. For the ISPD 2012 Contest benchmarks, the leakage power of our solutions is, on average, 9.53% smaller than and 12.45% smaller than . The sizing produced using our approach achieved the first place in the ISPD 2013 Discrete Gate Sizing Contest with, on average, 8.78% better power results than the second place tool. With new timing calculation applied, this flow can provide, on average, an extra 9.62% power reduction compared to the best Contest results. This flow is also the first gate sizing method to report violation-free solutions for all benchmarks of the ISPD 2013 Contest.
Keywords
logic circuits; logic design; LR method; Lagrangian relaxation; Vth assignment; leakage power reduction; simultaneous gate sizing method; threshold voltage; timing recovery method; zero positive slack; Benchmark testing; Delays; Linear programming; Logic gates; Optimization; Sensitivity; $V_{th}$ assignment; EDA; Lagrangian Relaxation (LR); gate sizing; leakage power; physical design;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2014.2305847
Filename
6774518
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