• DocumentCode
    389776
  • Title

    Signal integrity simulation and analysis in high-speed interconnects by using FDTD

  • Author

    Er-Ping, Li ; Wei-Liang, Yuan

  • Author_Institution
    Computational Electromagn. & Electron. Div., Inst. of High Performance Comput., Singapore, Singapore
  • fYear
    2002
  • fDate
    21-24 May 2002
  • Firstpage
    268
  • Lastpage
    271
  • Abstract
    With the advancements in microelectronics, interest in electromagnetic interference and compatibility in high-speed circuits has greatly increased in the engineering community, and applications of computational electromagnetics to electromagnetic interference and compatibility (EMI/EMC) engineering become an emerging technology. Termination, via, and crosstalk on interconnection lines will raise EMI problems in high-speed circuits and will therefore require more attention during the design phase for signal integrity. This paper presents signal propagation effect analysis on high-speed interconnection lines, between different parts, with the finite-difference time-domain method. The mechanisms and effectiveness of control measures are examined, which could be applied to high-speed circuit design.
  • Keywords
    computational electromagnetics; crosstalk; electromagnetic compatibility; electromagnetic interference; finite difference time-domain analysis; interconnections; EMC; EMI control measures; FDTD; computational electromagnetics; crosstalk; electromagnetic compatibility; electromagnetic interference; finite-difference time-domain methods; high-speed interconnects; interconnection line terminations; signal integrity analysis; signal integrity simulation; signal propagation effect analysis; via holes; Analytical models; Circuit simulation; Computational modeling; Electromagnetic compatibility and interference; Electromagnetic interference; Finite difference methods; Integrated circuit interconnections; Microelectronics; Signal analysis; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2002 3rd International Symposium on
  • Print_ISBN
    0-7803-7277-8
  • Type

    conf

  • DOI
    10.1109/ELMAGC.2002.1177422
  • Filename
    1177422