DocumentCode
389782
Title
EMI detection by means of wavelet
Author
Wu, Wei
Author_Institution
Dipt. di Elettronica e Inf., Padova Univ., Italy
fYear
2002
fDate
21-24 May 2002
Firstpage
454
Lastpage
457
Abstract
This paper proposes a new EMI detection approach. The approach uses a wavelet to analyze various waveforms (generated by CAD or measured by digital oscilloscope) in a particular circuit, identify specialized EMI spectrum distribution in the circuit layout in order to assist removing EMI quickly. An EMI detection application for a DC-DC converter is also offered.
Keywords
DC-DC power convertors; electromagnetic compatibility; electromagnetic interference; printed circuit layout; waveform analysis; wavelet transforms; DC-DC converter; EMI detection approach; EMI removal; EMI spectrum distribution; PCB; circuit layout; waveform analysis; wavelet; Circuit faults; Circuit testing; Electromagnetic compatibility; Electromagnetic interference; Electronic equipment testing; Frequency measurement; Oscilloscopes; Particle measurements; Wavelet analysis; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2002 3rd International Symposium on
Print_ISBN
0-7803-7277-8
Type
conf
DOI
10.1109/ELMAGC.2002.1177468
Filename
1177468
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