DocumentCode :
389847
Title :
Development of Ag-sheathed Bi2223 superconducting wires
Author :
Ayai, N. ; Hayashi, K. ; Kaneko, T. ; Ohkura, K. ; Kato, T. ; Fujikami, J. ; Kobayashi, S. ; Ueno, E. ; Takei, H. ; Sato, K.
Author_Institution :
Sumitomo Electr. Industries Ltd., Osaka, Japan
Volume :
2
fYear :
2002
fDate :
6-10 Oct. 2002
Firstpage :
1310
Abstract :
SEI has established the whole scheme on the I-V evaluation and the total length assurance for Ag-sheathed Bi2223 superconducting wires to keep up with advanced application studies. They consists of the temperature and magnetic field variable critical current measurement system, the sequential critical current measurement system with an automatic defect-catch function and the full length I-V measurement at 77.3 K in liquid nitrogen using a noninductive coil method. The integrated intelligence from these three systems assures the wide range I-V performance under any required conditions of temperature and magnetic field, which is a first priority for all of the superconducting applications.
Keywords :
bismuth compounds; calcium compounds; critical current density (superconductivity); electric current measurement; high-temperature superconductors; silver; strontium compounds; superconducting cables; temperature measurement; voltage measurement; 77.3 K; Ag-sheathed Bi2223 superconducting wires; Bi2223 superconductor; Bi2Sr2Ca2Cu3O-Ag; I-V evaluation; automatic defect-catch function; critical current density; critical current measurement system; electric power cable; full length I-V measurement; integrated intelligence; liquid nitrogen; magnetic field; magnetic field variable critical current measurement system; noninductive coil method; sequential critical current measurement; temperature measurement system; total length assurance; Critical current density; Current measurement; Length measurement; Magnetic field measurement; Magnetic fields; Superconducting cables; Superconducting coils; Superconducting filaments and wires; Superconducting magnets; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transmission and Distribution Conference and Exhibition 2002: Asia Pacific. IEEE/PES
Print_ISBN :
0-7803-7525-4
Type :
conf
DOI :
10.1109/TDC.2002.1177669
Filename :
1177669
Link To Document :
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