Title :
A new method for analyzing s-t reliability of communication networks
Author :
Yunxiao, Zu ; Yugeng, Sun ; Zanji, Wang
Author_Institution :
Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
Abstract :
A new method, state transition(ST), for analyzing s-t reliability of communication networks is developed . ST is based on the finding that the message transmission process can be described by the Markov chain with two absorbing states. With ST all the non-absorbing states can be generated with depth-first search or breadth-first search and the network reliability can be computed with a back reiteration technique after computing the one-step transition probability between states.
Keywords :
Markov processes; iterative methods; probability; search problems; telecommunication network reliability; Markov chain; back reiteration technique; breadth-first search; communication network reliability; depth-first search; message transmission; nonabsorbing states; one-step transition probability; s-t reliability; Communication networks; Computer hacking; Computer networks; Reliability engineering; Sun; Telecommunication network reliability; Wire;
Conference_Titel :
TENCON '02. Proceedings. 2002 IEEE Region 10 Conference on Computers, Communications, Control and Power Engineering
Print_ISBN :
0-7803-7490-8
DOI :
10.1109/TENCON.2002.1180237
