• DocumentCode
    3905
  • Title

    Low-Coherence Virtual Reference Interferometry for Dispersion Analysis

  • Author

    Galle, Michael A. ; Li Qian

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
  • Volume
    26
  • Issue
    20
  • fYear
    2014
  • fDate
    Oct.15, 15 2014
  • Firstpage
    2020
  • Lastpage
    2022
  • Abstract
    We present low-coherence virtual reference interferometry (LC-VRI) for short length (<;1 m) fiber dispersion characterization using a broadband LED source and a low-resolution spectrometer or spectrum analyzer. The LC-VRI is a simple and convenient alternative to balanced spectral interferometry (BSI), capable of measuring both first- and second-order dispersion directly from the interference pattern. The main advantage of using LC-VRI instead of BSI is that full characterization can be performed from a single spectral scan, without the need for precision control of the reference path. The technique is demonstrated for the characterization of SMF28 fiber and the results are compared with the manufacturer´s specifications and to measurements obtained using BSI. The standard deviation of the first- and second-order dispersion is found to be on the order of 10-3 ps and 10-4 ps/nm, respectively, for both BSI and LC-VRI.
  • Keywords
    light coherence; light emitting diodes; light interference; light interferometry; light sources; optical fibre dispersion; optical fibre testing; spectrometers; SMF28 fiber characterization; balanced spectral interferometry; broadband LED source; first-order dispersion measurement; interference pattern; low-coherence virtual reference interferometry; low-resolution spectrum analyzer; second-order dispersion measurement; short length fiber dispersion characterization; standard deviation; Interference; Optical fiber dispersion; Optical fiber testing; Optical fibers; Optical interferometry; Wavelength measurement; Chromatic dispersion; measurement techniques; optical fiber dispersion; optical fiber testing; optical interferometry;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2014.2344441
  • Filename
    6868210