DocumentCode :
390551
Title :
A wavelet-based multisensor image registration algorithm
Author :
Xishan, Huang ; Zhe, Chen
Author_Institution :
Sch. of Autom. Sci. & Electr. Eng., Beijing Univ. of Aeronaut. & Astronaut., China
Volume :
1
fYear :
2002
fDate :
26-30 Aug. 2002
Firstpage :
773
Abstract :
Multisensor images have different gray level characteristics while contours representing region boundaries are preserved in most cases. A contour-based registration algorithm which uses region boundaries and other well-defined edges as matching primitives is presented. This algorithm integrates the invariant moments with the orientation function of the contours to establish the correspondences of the contours in the two images, e.g. CCD and infrared (IR). The improved wavelet-based fuzzy contour extraction is developed. For the feature matching, an orientation function matching is proposed and integrated to the invariant moments to correspond the extracted contours. The contours with at least two salient points and others with only one salient point are matched separately. The correspondence salient points are used as control-point pairs, and the transformation parameters are estimated based on them. This approach implements automatically and works well for the image pairs in which contour information is well preserved. Experimental results for the CCD and IR images are used to test and verify the theory and algorithm presented in this in this paper.
Keywords :
edge detection; feature extraction; image matching; image registration; sensor fusion; wavelet transforms; CCD images; IR images; contour-based registration algorithm; feature matching; fuzzy contour extraction; gray level characteristics; image registration; infrared images; invariant moments; matching primitives; multisensor images; orientation function; region boundaries; salient points; wavelet-based algorithm; well-defined edges; Automatic control; Automation; Charge coupled devices; Computer vision; Feature extraction; Image edge detection; Image registration; Parameter estimation; Testing; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Processing, 2002 6th International Conference on
Print_ISBN :
0-7803-7488-6
Type :
conf
DOI :
10.1109/ICOSP.2002.1181170
Filename :
1181170
Link To Document :
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