DocumentCode :
391514
Title :
Control and signal processing for photoresist processing in microlithography
Author :
Tay, Arthur ; Ho, Weng Khuen ; Lim, Khiang Wee ; Loh, Ai Poh ; Tan, Woei Wan
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore
Volume :
2
fYear :
2002
fDate :
5-8 Nov. 2002
Firstpage :
1468
Abstract :
The lithography process is a critical step in the fabrication of nanostructures for integrated circuit manufacturing. In this paper, a summary is presented of several projects applying control and signal processing techniques to lithography. We begin with a presentation of a nonoptical lithography process under development in our lab. The proposed lithography technique is based on chemically altering the surface in a spatially selective manner to achieve a patterned substrate. In addition to the exposure step, photoresist processing is also critical in lithography. Based on current limitations of photoresist thermal processing system, a new integrated system is designed to improve the performance of temperature sensitive chemically amplified photoresists used in deep-UV lithography. Two case studies where control and signal processing techniques have made an impact in photoresist processing are also presented.
Keywords :
integrated circuit manufacture; manufacturing processes; photoresists; process control; signal processing; ultraviolet lithography; deep-UV lithography; exposure step; integrated circuit manufacturing; integrated system; microlithography; nanostructure fabrication; nonoptical lithography process; patterned substrate; photoresist processing; photoresist thermal processing system; signal processing; temperature sensitive chemically amplified photoresists; Chemical processes; Costs; Integrated circuit manufacture; Lithography; Manufacturing processes; Process control; Resists; Signal processing; Temperature control; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IECON 02 [Industrial Electronics Society, IEEE 2002 28th Annual Conference of the]
Print_ISBN :
0-7803-7474-6
Type :
conf
DOI :
10.1109/IECON.2002.1185495
Filename :
1185495
Link To Document :
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