• DocumentCode
    391545
  • Title

    Lead-free solder evaluation for ball attache process

  • Author

    Anand, Ashok ; Mui, Y.C.

  • Author_Institution
    Adv. Micro Devices, Singapore, Singapore
  • fYear
    2002
  • fDate
    10-12 Dec. 2002
  • Firstpage
    6
  • Lastpage
    10
  • Abstract
    In recent years, increasing awareness of lead-free requirement in electronics industry is driving the need to investigate lead-free solder systems in detail. This paper investigates three types of solder alloys, Sn/3.8Ag/0.7Cu, Sn/3.5Ag and Sn/0.7Cu used in a ball attache process. The scope of this paper covers lead-free solder system, comprehensively from ball attache process to board assembly reliability. This includes study on intermetallics at substrate-ball interface, PCB-ball interface, solid state diffusion study, shear force trend, failure modes and thermal cycling study of solder joints when assembled with Ni/Au and OSP finished PCBs. It was observed that the low processing temperature of Sn/3.5Ag and Sn/3.8Ag/0.7Cu make them viable lead-free alloys to implement in assembly lines. The solder life performance of these alloys is better than Sn/37Pb alloy on Ni/Au PCB but does not fare well on OSP finished PCBs. On the other hand, Sn/0.7Cu solder has a process temperature that is ten degrees above Sn/3.5Ag and Sn/3.8Ag/0.7Cu but solder life performance on Ni/Au and OSP finished PCBs fares better than other lead-free and tin-lead alloys.
  • Keywords
    circuit reliability; failure analysis; microassembling; printed circuit manufacture; reflow soldering; OSP finished PCBs; PCB-ball interface; Sn/0.7Cu; Sn/3.5Ag; Sn/3.8Ag/0.7Cu; SnAg; SnAgCu; SnCu; assembly lines; ball attache process; board assembly reliability; electronics industry; failure modes; intermetallics; lead-free solder evaluation; process temperature; processing temperature; shear force trend; solder life performance; solid state diffusion study; substrate-ball interface; thermal cycling study; Assembly systems; Electronics industry; Environmentally friendly manufacturing techniques; Gold alloys; Intermetallic; Lead; Nickel alloys; Temperature; Thermal force; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2002. 4th
  • Print_ISBN
    0-7803-7435-5
  • Type

    conf

  • DOI
    10.1109/EPTC.2002.1185588
  • Filename
    1185588