DocumentCode
391546
Title
Lead-free semiconductor packaging
Author
Beelen-Hendrikx, C.C.M. ; Klerk, J. ; van der Water, J.T.
Author_Institution
Philips Centre for Ind. Technol., Eindhoven, Netherlands
fYear
2002
fDate
10-12 Dec. 2002
Firstpage
11
Lastpage
19
Abstract
Pending lead-free legislation and OEM customer demand force semiconductor companies to changeover to lead-free packages. Packages must have a lead-free terminal plating and, for modules, first level interconnect of e.g. flip chips and passives has to be lead-free. The current and lead-free packages have to be qualified for current (lead-free packages only) and lead-free assembly processes. The main hurdles are the qualification for the moisture sensitivity level (MSL) and the choice of the lead-free plating type. Due to the higher reflow temperature for lead-free assembly, a drop of the MSL of one or two levels is observed for some IC package types and encapsulated modules. With adapted encapsulation materials, the MSL is improved. Matt Sn is the preferred lead-free plating type because of the good compatibility with the current plating, easy processability, good solderability, low cost and low environmental impact. Whiskering during package storage, however, is a point of attention. At the moment no proper accelerated whisker test is available.
Keywords
flip-chip devices; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; interconnections; microassembling; modules; moisture; reflow soldering; semiconductor device packaging; surface mount technology; tin; whiskers (crystal); IC package types; SMD packages; Sn; encapsulated modules; flip chips; lead-free assembly processes; lead-free module first level interconnect; lead-free plating type; lead-free semiconductor packaging; lead-free terminal plating; matt Sn; moisture sensitivity level; reflow temperature; whisker growth; whiskering; Assembly; Environmentally friendly manufacturing techniques; Flip chip; Integrated circuit packaging; Lead compounds; Legislation; Moisture; Qualifications; Semiconductor device packaging; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2002. 4th
Print_ISBN
0-7803-7435-5
Type
conf
DOI
10.1109/EPTC.2002.1185589
Filename
1185589
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