DocumentCode :
391556
Title :
On the moduli of viscoelastic materials
Author :
Zhang, X.R. ; Pang, John H.L. ; Shi, X.Q. ; Wang, Z.P.
Author_Institution :
Sch. of Mech. & Production Eng., Nanyang Technol. Univ., Singapore
fYear :
2002
fDate :
10-12 Dec. 2002
Firstpage :
318
Lastpage :
322
Abstract :
The moduli of viscoelastic materials are dependent on temperature and time. Polymeric materials are widely used in electronic packaging as encapsulation, underfill and die attach. The viscoelastic model offers better representation of material performance than the linear elastic model. It is important to provide the viscoelastic properties for polymeric materials in electronic packages for finite element analysis (FEA) modeling. In this paper, different concepts for describing the moduli of viscoelastic materials have been reviewed. Analysis on how to correlate different types of tests for the determination of different moduli of viscoelastic materials was performed. Results obtained from a constant-strain-rate tensile test were employed to illustrate the applicability of the elastic modulus concept. It was found that the tangent modulus or the differential of the stress-strain curve from constant strain rate test is equivalent to the relaxation modulus from a stress relaxation test. The plot of σ / α versus ε / α is no longer dependent on the strain rate for linear viscoelasticity. The difference between the moduli behavior of viscoelastic materials and that of linear elastic material was also discussed.
Keywords :
elastic moduli; finite element analysis; plastic packaging; polymers; stress relaxation; stress-strain relations; viscoelasticity; FEA modeling; constant-strain-rate tensile test; die attach materials; elastic modulus; electronic packaging; encapsulation; finite element analysis; linear viscoelasticity; polymeric materials; relaxation modulus; stress relaxation test; stress-strain curve; tangent modulus; temperature dependent moduli; time dependent moduli; underfill; viscoelastic material moduli; viscoelastic model; Capacitive sensors; Elasticity; Electronics packaging; Encapsulation; Finite element methods; Microassembly; Polymers; Temperature dependence; Testing; Viscosity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2002. 4th
Print_ISBN :
0-7803-7435-5
Type :
conf
DOI :
10.1109/EPTC.2002.1185690
Filename :
1185690
Link To Document :
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