DocumentCode
391715
Title
SoC interconnect in deep submicron
Author
Elgamel, Mohmed ; Crochet, Stacy ; Bayoumi, Magdy
Author_Institution
Center for Adv. Comput. Studies, Louisiana Univ., Lafayette, LA, USA
Volume
2
fYear
2002
fDate
4-7 Aug. 2002
Abstract
The migration to using ultra deep-submicron (UDSM) processes of 0.25 μm or below has enabled the integration of complete electronic systems onto one single chip. These systems-on-chip (SoCs) introduce various challenges in terms of design flows and CAD tools. A design methodology that allows component reuse and intellectual property is necessary for achieving the required functionality, performance and testability while minimizing the cost and time to market. This design methodology relies on the use of a standardized connection interface like a shared bus, which presents increasing difficulties in SoC. This paper describes research directions and various levels of design abstraction to increase the performance of interconnects. These directions include approaches to adopt new analytical models for interconnects and ways to face these challenges early in the design flow. To maximize the benefits of this paper, an extensive set of references is given.
Keywords
circuit CAD; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; network routing; software tools; system-on-chip; 0.25 micron; CAD tools; SoC; SoC interconnect; component reuse; cost minimization; design flow; design flows; design methodology; functionality; intellectual property; interconnect analytical models; single chip electronic systems integration; standardized connection interface; system-on-chip; testability; time to market; ultra deep-sub-micron process; Circuit noise; Clocks; Delay; Design methodology; Integrated circuit interconnections; Power supplies; Power system interconnection; RF signals; Radio frequency; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on
Print_ISBN
0-7803-7523-8
Type
conf
DOI
10.1109/MWSCAS.2002.1186808
Filename
1186808
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