DocumentCode :
391715
Title :
SoC interconnect in deep submicron
Author :
Elgamel, Mohmed ; Crochet, Stacy ; Bayoumi, Magdy
Author_Institution :
Center for Adv. Comput. Studies, Louisiana Univ., Lafayette, LA, USA
Volume :
2
fYear :
2002
fDate :
4-7 Aug. 2002
Abstract :
The migration to using ultra deep-submicron (UDSM) processes of 0.25 μm or below has enabled the integration of complete electronic systems onto one single chip. These systems-on-chip (SoCs) introduce various challenges in terms of design flows and CAD tools. A design methodology that allows component reuse and intellectual property is necessary for achieving the required functionality, performance and testability while minimizing the cost and time to market. This design methodology relies on the use of a standardized connection interface like a shared bus, which presents increasing difficulties in SoC. This paper describes research directions and various levels of design abstraction to increase the performance of interconnects. These directions include approaches to adopt new analytical models for interconnects and ways to face these challenges early in the design flow. To maximize the benefits of this paper, an extensive set of references is given.
Keywords :
circuit CAD; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; network routing; software tools; system-on-chip; 0.25 micron; CAD tools; SoC; SoC interconnect; component reuse; cost minimization; design flow; design flows; design methodology; functionality; intellectual property; interconnect analytical models; single chip electronic systems integration; standardized connection interface; system-on-chip; testability; time to market; ultra deep-sub-micron process; Circuit noise; Clocks; Delay; Design methodology; Integrated circuit interconnections; Power supplies; Power system interconnection; RF signals; Radio frequency; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on
Print_ISBN :
0-7803-7523-8
Type :
conf
DOI :
10.1109/MWSCAS.2002.1186808
Filename :
1186808
Link To Document :
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