Title :
On-chip iDD pulse response method using a high-speed dynamic current sensor
Author :
Aceved, Gladys Omayra Ducoudray ; Ramírez-Angulo, Jaime
Author_Institution :
Klipsch Sch. of Electr. & Comput. Eng., New Mexico State Univ., Las Cruces, NM, USA
Abstract :
This paper presents design considerations for a high-speed dynamic current sensor for iDD analysis. This testing scheme, known as the iDD pulse response method is a built-in scheme for analog, digital and mixed-signal circuitry compatible with the IEEE 1149.4 mixed-signal test bus standard. A high-speed dynamic current sensor is required for this method and is described in this paper. Simulation results are provided for the current sensor used to observe the iDD supply current of analog and digital devices. Simulation results include iDD waveforms of defect-free circuits, for circuits with parametric/global faults, and circuits with catastrophic faults. This testing technique serves as an early screening method for defect-free circuits and will potentially allow a fault-free IC to enter the market in significantly less time.
Keywords :
automatic testing; electric sensing devices; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; IEEE 1149.4 mixed-signal test bus standard; catastrophic faults; defect-free circuits; high-speed dynamic current sensor; mixed-signal circuitry; on-chip iDD pulse response method; parametric/global faults; pulse response method; screening method; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Current supplies; Design engineering; Pulse circuits; Pulse measurements; Pulsed power supplies; Voltage;
Conference_Titel :
Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on
Print_ISBN :
0-7803-7523-8
DOI :
10.1109/MWSCAS.2002.1186853
