DocumentCode :
391877
Title :
An alternative method for characterizing capacitor matching
Author :
Tiew, Kee-Chee ; Geiger, Randall
Author_Institution :
Dept. of Electr. Eng. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Volume :
1
fYear :
2002
fDate :
4-7 Aug. 2002
Abstract :
An alternative method for characterizing capacitor matching is presented. The basic idea of this method is to sense the mismatch among the capacitors by amplifying the error voltage using an iterative switched-capacitor scheme. Through simulation, this method has shown an attractive property for sensing capacitor mismatches down to 1% and smaller.
Keywords :
calibration; data conversion; switched capacitor networks; BIST systems; SC circuits; built-in self-test systems; capacitor matching; capacitor mismatch; error voltage; on-chip calibration; switched-capacitor scheme; Calibration; Charge transfer; Circuit optimization; Circuit simulation; Iterative methods; Monitoring; Switched capacitor circuits; Switching circuits; Switching converters; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on
Print_ISBN :
0-7803-7523-8
Type :
conf
DOI :
10.1109/MWSCAS.2002.1187203
Filename :
1187203
Link To Document :
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