• DocumentCode
    392511
  • Title

    Channel flow network at low electric field with high flow resistance compensation pattern

  • Author

    Jeong, Yongwon ; Han, Yongsuk ; Kim, Songyi ; Lee, Haehyung ; Chang, Jun Keun ; Cho, Dongil Dan ; Chung, Doo Soo ; Chun, Kukjin

  • Author_Institution
    Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
  • fYear
    2003
  • fDate
    19-23 Jan. 2003
  • Firstpage
    431
  • Lastpage
    434
  • Abstract
    This paper presents the possible factors associated with the degradation that can be generated in a channel network structure and provides a solution to overcome this and assure high reliability. Cyclic capillary electrophoresis, which is the one of the channel network structures, has advantages in downsizing and a low operation voltage. However, there are some problems such as sample loss when the injected plug encounters the junctions in the middle of the channel. This paper explains the phenomenon of the cyclic CE as an example of the channel network structure. In the new design, the quartz cyclic CE chip showed < 2 % degradation per junction. This means the high resolution CE analysis has 100,000 plate numbers after a three and one quarter cycle (20.4 cm) in just a 4 cm × 4 cm chip.
  • Keywords
    capillarity; channel flow; electrohydrodynamics; electrophoresis; microfluidics; 4 cm; channel flow network; channel network structure; channel network structures; cyclic capillary electrophoresis; downsizing; high flow resistance compensation pattern; high reliability; injected plug; low electric field; low operation voltage; Chemistry; Degradation; Electric resistance; Electrokinetics; Electronic mail; Optical attenuators; Plugs; Telephony; Testing; Toy manufacturing industry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2003. MEMS-03 Kyoto. IEEE The Sixteenth Annual International Conference on
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-7744-3
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2003.1189778
  • Filename
    1189778