DocumentCode
392511
Title
Channel flow network at low electric field with high flow resistance compensation pattern
Author
Jeong, Yongwon ; Han, Yongsuk ; Kim, Songyi ; Lee, Haehyung ; Chang, Jun Keun ; Cho, Dongil Dan ; Chung, Doo Soo ; Chun, Kukjin
Author_Institution
Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
fYear
2003
fDate
19-23 Jan. 2003
Firstpage
431
Lastpage
434
Abstract
This paper presents the possible factors associated with the degradation that can be generated in a channel network structure and provides a solution to overcome this and assure high reliability. Cyclic capillary electrophoresis, which is the one of the channel network structures, has advantages in downsizing and a low operation voltage. However, there are some problems such as sample loss when the injected plug encounters the junctions in the middle of the channel. This paper explains the phenomenon of the cyclic CE as an example of the channel network structure. In the new design, the quartz cyclic CE chip showed < 2 % degradation per junction. This means the high resolution CE analysis has 100,000 plate numbers after a three and one quarter cycle (20.4 cm) in just a 4 cm × 4 cm chip.
Keywords
capillarity; channel flow; electrohydrodynamics; electrophoresis; microfluidics; 4 cm; channel flow network; channel network structure; channel network structures; cyclic capillary electrophoresis; downsizing; high flow resistance compensation pattern; high reliability; injected plug; low electric field; low operation voltage; Chemistry; Degradation; Electric resistance; Electrokinetics; Electronic mail; Optical attenuators; Plugs; Telephony; Testing; Toy manufacturing industry;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 2003. MEMS-03 Kyoto. IEEE The Sixteenth Annual International Conference on
ISSN
1084-6999
Print_ISBN
0-7803-7744-3
Type
conf
DOI
10.1109/MEMSYS.2003.1189778
Filename
1189778
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