Visible and x-ray spectroscopy studies of defects in CdTe

Author

Gupta, A. ; Compaan, A.D. ; Price, K. ; Vasko, A. ; Hinko, K. ; Liu, X. ; Fritts, M. ; Leyarovska, N. ; Terry, J.

Author_Institution

Dept. of Phys., Toledo Univ., OH, USA

fYear

2002

fDate

19-24 May 2002

Firstpage

492

Lastpage

495

Abstract

We have used electroluminescence (EL), photoluminesence (PL), and synchrotron x-ray fluorescence (XRF) to study some of the properties of defects related to Cu and Na in polycrystalline thin films of CdTe. Some samples were prepared by ion implantation of CdTe single crystals followed by thermal anneal to remove the damage. Others were prepared by magnetron sputtering on quartz or borosilicate glass followed by vapor CdCl₂ heat treatment. EL was studied from sputtered CdS/CdTe solar cell structures. We find that EL is very sensitive to defects induced by light soaking; ion implantation-induced damage can be annealed at 400 C to yield good PL; and synchrotron XRF shows the presence of substantial copper in films sputtered from nominally pure CdTe.

Keywords

II-VI semiconductors; annealing; cadmium compounds; copper; electroluminescence; fluorescence; ion beam effects; photoluminescence; semiconductor thin films; sodium; solar cells; sputtered coatings; 400 degC; CdCl₂; CdS-CdTe; CdS/CdTe solar cell structure; CdTe:Cu,Al; annealing; defects; electroluminescence; ion implantation; light soaking; magnetron sputtering; photoluminesence; synchrotron x-ray fluorescence; vapor CdCl₂ heat treatment; x-ray spectroscopy; Annealing; Copper; Crystals; Electroluminescent devices; Fluorescence; Glass; Ion implantation; Spectroscopy; Sputtering; Synchrotrons;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE

ISSN

1060-8371

Print_ISBN

0-7803-7471-1

Type

conf

DOI

10.1109/PVSC.2002.1190609

Filename

1190609