• DocumentCode
    392648
  • Title

    Molecular level pathway to CIS deposition without post treatments

  • Author

    Menezes, Shalini

  • Author_Institution
    InterPhases Res., Thousand Oaks, CA, USA
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    660
  • Lastpage
    663
  • Abstract
    CuInSe2 (CIS) based thin-film devices could potentially provide high specific power for terrestrial or space power if they were fabricated at low temperatures on low-density polymer substrates. This paper presents a molecular level electrochemical approach that may permit direct deposition of morphologically homogenous, stoichiometric CIS-alloy absorber layers without high temperature post treatments. The paper investigates the effects of deposition parameters by monitoring voltammetric characteristics, pulsed flow/deposition waveforms and film composition with different deposition system configurations. It distinguishes the CIS formation reaction mechanisms in bulk and thin layer electrolytes and identifies two new deposition parameters to increase the content of difficult-to-electrodeposit metals like In and Ga. The results provide directions for low-temperature synthesis of device quality absorber layers for efficient, inexpensive PV modules.
  • Keywords
    copper compounds; electrodeposition; electrodeposits; indium compounds; semiconductor growth; semiconductor thin films; ternary semiconductors; CIS based thin-film devices; CIS deposition; CIS-alloy absorber layers; CuInSe2; deposition parameters; film composition; low-temperature synthesis; molecular level electrochemical approach; voltammetric characteristics; Chemicals; Computational Intelligence Society; Condition monitoring; Epitaxial growth; Maximum likelihood estimation; Polymer films; Production; Substrates; Temperature; Thin film devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190651
  • Filename
    1190651