Title :
Micrononuniformity effects in thin-film photovoltaics
Author :
Karpov, V.G. ; Compaan, A.D. ; Shvydka, Diana
Author_Institution :
Dept. of Phys. & Astron., Toledo Univ., OH, USA
Abstract :
We discuss the effects of micrononuniformities on thin-film photovoltaics. The key factors are the device large area and the presence of potential barriers. We model the nonuniformity effects in terms of random microdiodes connected in parallel through a resistive electrode. Microdiodes of low open circuit voltage affect macroscopically large regions. They strongly reduce the device performance and induce nonuniform degradation in several different modes. We support our predictions with experimental results on CdTe/CdS dot cells.
Keywords :
II-VI semiconductors; cadmium compounds; defect states; semiconductor device models; semiconductor device reliability; semiconductor thin films; solar cells; CdTe-CdS; CdTe/CdS dot cells; device large area; low open circuit voltages; micrononuniformity effects; nonuniform degradation; nonuniformity effects modeling; parallel connected random microdiodes; potential barriers; resistive electrode; thin-film photovoltaics; Circuits; Degradation; Grain boundaries; Heat treatment; Millimeter wave devices; Photovoltaic cells; Physics; Semiconductor diodes; Thin film devices; Transistors;
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
Print_ISBN :
0-7803-7471-1
DOI :
10.1109/PVSC.2002.1190663
