Title :
Field test results on the stability of 2400 photovoltaic modules manufactured in 1990s
Author :
Hishikawa, Yoshihiro ; Morita, Kengo ; Sakamoto, Sadao ; Oshiro, Toshimitsu
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Ibaraki, Japan
Abstract :
Long-term stability of photovoltaic (PV) modules has been systematically investigated by indoor and outdoor measurements, based on about 2400 field test PV modules manufactured in 1990s. Investigation was focused on changes in the photovoltaic performance of the modules as well as the visual defects which may affect the reliability of the modules in the range of 20-30 years. All the measured module showed initial loss in Isc. Some of the modules showed reduced Isc due to cloudy discoloration or delamination at cell/EVA interface, increased series resistance Rs probably due to the degradation in electrode soldering, or breaking of the cover glass. Although the overall system performance showed no distinct change within the 10 years of field test, the present results suggest that the above degradation features can affect the reliability of 20-30 years.
Keywords :
delamination; electric current measurement; electric resistance measurement; encapsulation; solar cell arrays; soldering; stability; temperature measurement; voltage measurement; cell/EVA interface; cloudy discoloration; cover glass breaking; delamination; electrode soldering degradation; field test PV modules; indoor measurements; long-term stability; outdoor measurements; photovoltaic modules; photovoltaic performance; reliability; series resistance; stability; temperature measurement; visual defects; voltage measurement; Degradation; Delamination; Electrical resistance measurement; Electrodes; Loss measurement; Manufacturing; Photovoltaic systems; Solar power generation; Stability; System testing;
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
Print_ISBN :
0-7803-7471-1
DOI :
10.1109/PVSC.2002.1190944