DocumentCode :
393032
Title :
Study on mechanism of cell damage caused by microbubbles exposed to ultrasound
Author :
Kudo, Nobuki ; Miyaoka, Takehiro ; Okada, Kengo ; Yamamoto, Katsuyuki ; Niwa, Koichi
Author_Institution :
Graduate Sch. of Eng., Hokkaido Univ., Sapporo, Japan
Volume :
2
fYear :
2002
fDate :
8-11 Oct. 2002
Firstpage :
1383
Abstract :
To elucidate the mechanisms of cell damage caused by microbubbles exposed to ultrasound, two series of experiments were carried out. In one series of experiments, microbubbles and cells were exposed to 1-MHz pulsed ultrasound and observed using a high-speed camera. In another series of experiments, endothelial cells were exposed to ultrasound with and without microbubbles, and the viabilities of the cells were evaluated by fluorescent staining. In the high-speed images, generation of a small stream of the surrounding liquid caused by nonuniform contraction of a microbubble and deformation of a cell beside the bubble were observed. In the cell viability test, the percentage of damaged cells in the presence of microbubbles that had been exposed to ultrasound was significantly higher than that of cells without microbubbles that had been exposed to ultrasound. These results indicated that bubbles exposed to ultrasound causes mechanical stress to act on cells and that this mechanical stress may cause cell injury.
Keywords :
biological effects of acoustic radiation; biological techniques; bubbles; cellular effects of radiation; fluorescence; high-speed optical techniques; ultrasonic effects; 1 MHz; cell damage; cell injury; cell viability test; damaged cells; endothelial cells; fluorescent staining; high-speed camera; high-speed images; mechanical stress; mechanisms; microbubbles; pulsed ultrasound; surrounding liquid; ultrasound contrast agents; Biomembranes; Cameras; Cells (biology); Glass; Image generation; Microscopy; Streaming media; Stress; Testing; Ultrasonic imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2002. Proceedings. 2002 IEEE
ISSN :
1051-0117
Print_ISBN :
0-7803-7582-3
Type :
conf
DOI :
10.1109/ULTSYM.2002.1192553
Filename :
1192553
Link To Document :
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