DocumentCode :
39319
Title :
Parallel Simulation of Large Linear Circuits With Nonlinear Terminations Using High-Order Stable Methods
Author :
Farhan, Mohd Aliff ; Gad, Emad ; Nakhla, Michel S. ; Achar, Ramachandra
Author_Institution :
Dept. of Electron., Carleton Univ., Ottawa, ON, Canada
Volume :
4
Issue :
7
fYear :
2014
fDate :
Jul-14
Firstpage :
1201
Lastpage :
1211
Abstract :
To meet the growing demand for efficient circuit simulation tools, Obreshkov formula (ObF)-based high-order integration methods were recently proposed. However, one of the challenges in this method is the growing computational cost of the solution at a particular time point with the increasing orders of the ObF. To address this issue and target high-speed circuits with large linear blocks and nonlinear loads, a new parallel framework is proposed in this paper to minimize the CPU time associated with the solution at any time point. For this purpose, recently identified special properties of the resulting circuit matrices and the node-tearing principles are exploited, while developing an efficient parallel simulation framework. Numerical examples are presented to demonstrate the validity and efficiency of the proposed parallel method.
Keywords :
circuit simulation; multiprocessing systems; time-domain analysis; CPU time; ObF-based high-order integration methods; Obreshkov formula-based high-order integration methods; circuit matrices; circuit simulation tools; large linear blocks; large linear circuits; node-tearing principles; nonlinear loads; nonlinear terminations; parallel simulation framework; Approximation methods; Equations; Integrated circuit modeling; Linear circuits; Load modeling; Program processors; Vectors; High-order L-stable methods; Obreshkov integration method; node-tearing partitioning; obreshkov integration method; parallel time-domain simulation; time-domain simulation; time-domain simulation.;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2014.2323118
Filename :
6826565
Link To Document :
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