Title :
Dynamic Specification Testing and Diagnosis of High-Precision Sigma-Delta ADCs
Author :
Sehun Kook ; Banerjee, Aritra ; Chatterjee, Abhijit
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Tech., Atlanta, GA, USA
Abstract :
High-resolution ADCs generally require high-end testers to ensure their performances meeting design specifications. This paper presents new test methods that facilitate to test such devices with low-cost testers.
Keywords :
sigma-delta modulation; dnamic specification testing; high-end tester; high-precision sigma-delta ADC; high-resolution ADC; low-cost tester; Computational modeling; Mathematical model; Noise measurement; Sigma-delta modulation; Signal to noise ratio; Testing; Analog-to-Digital converters (ADCs); Sigma-delta (ÄÓ); alternate test; built-in-self-test (BIST); design-for-test (DfT); device under test (DUT); dynamic specifications test; fast Fourier transform (FFT);
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDT.2012.2217111
