• DocumentCode
    39321
  • Title

    Dynamic Specification Testing and Diagnosis of High-Precision Sigma-Delta ADCs

  • Author

    Sehun Kook ; Banerjee, Aritra ; Chatterjee, Abhijit

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Tech., Atlanta, GA, USA
  • Volume
    30
  • Issue
    4
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    36
  • Lastpage
    48
  • Abstract
    High-resolution ADCs generally require high-end testers to ensure their performances meeting design specifications. This paper presents new test methods that facilitate to test such devices with low-cost testers.
  • Keywords
    sigma-delta modulation; dnamic specification testing; high-end tester; high-precision sigma-delta ADC; high-resolution ADC; low-cost tester; Computational modeling; Mathematical model; Noise measurement; Sigma-delta modulation; Signal to noise ratio; Testing; Analog-to-Digital converters (ADCs); Sigma-delta (ÄÓ); alternate test; built-in-self-test (BIST); design-for-test (DfT); device under test (DUT); dynamic specifications test; fast Fourier transform (FFT);
  • fLanguage
    English
  • Journal_Title
    Design & Test, IEEE
  • Publisher
    ieee
  • ISSN
    2168-2356
  • Type

    jour

  • DOI
    10.1109/MDT.2012.2217111
  • Filename
    6296281
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=39321