DocumentCode
393288
Title
Noise reduction in ultrasonic NDT using discrete wavelet transform processing
Author
Lazaro, J.C.
Author_Institution
Dept. de Informatica y Automatica, Univ. Nacional de Educacion a Distancia, Madrid, Spain
Volume
1
fYear
2002
fDate
8-11 Oct. 2002
Firstpage
777
Abstract
Discrete Wavelet Processing, with decomposition level-dependent threshold selection is used for the enhancement of the signal-to-noise ratio (SNR) of synthetic and experimental ultrasonic pulse-echo registers. An analysis of the SNR improvement is performed from the results obtained by processing synthetic grain noise registers having an incrusted flaw signal. Different threshold selection techniques, including Universal, Minimax and Sure rules, have been used. An alternative processing of the wavelet coefficients, with pruning and threshold selection based on the statistics of the squared coefficients at the particular scales is proposed.
Keywords
acoustic noise; discrete wavelet transforms; grain boundaries; ultrasonic materials testing; decomposition level-dependent threshold selection; discrete wavelet transform processing; incrusted flaw signal; noise reduction; signal-to-noise ratio; squared coefficients; synthetic grain noise registers; ultrasonic NDT; ultrasonic pulse-echo registers; wavelet coefficients; Discrete wavelet transforms; Frequency dependence; Minimax techniques; Noise reduction; Scattering; Signal analysis; Signal processing; Signal to noise ratio; Wavelet coefficients; Wavelet domain;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2002. Proceedings. 2002 IEEE
ISSN
1051-0117
Print_ISBN
0-7803-7582-3
Type
conf
DOI
10.1109/ULTSYM.2002.1193514
Filename
1193514
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