DocumentCode :
393310
Title :
High rejection Rx filters for GSM handsets with wafer level packaging
Author :
Wang, Kun ; Mueller, William ; Ruby, Richard ; Gat, Moshe ; Bradley, Paul ; Barfknecht, Andrew ; Geefay, Frank ; Han, Cheol ; Gan, Gene ; Chien, Allen ; Ly, Ba
Author_Institution :
Agilent Technol., Newark, CA, USA
Volume :
1
fYear :
2002
fDate :
8-11 Oct. 2002
Firstpage :
925
Abstract :
We present results of PCS and DCS Rx filters based on thin film bulk acoustic resonator (FBAR) technology for GSM handset application. The typical minimum rejection performances for PCs Rx filters are >18dB in the band of 1830-1910 MHz and 2010-2070 MHz, and >29 dB outside of the 1830-2070 MHz range. The typical minimum rejections for DCS Rx filters are >18 dB in the band of 1705-1785 MHz and 1820-1980 MHz, and >29 dB outside of the 1705-1980 MHz range. The filters consist of seven FBARs electrically coupled in a ladder topology, and are hermetically sealed using wafer-level packaging. The die sizes of PCs and DCS Rx filters are 0.7×0.8×0.25 mm and 0.9×0.9×0.25 mm, respectively.
Keywords :
acoustic resonator filters; bulk acoustic wave devices; ladder filters; mobile handsets; thin film devices; wafer-scale integration; 0.25 mm; 0.7 mm; 0.8 mm; 0.9 mm; 1705 to 1785 MHz; 1820 to 1980 MHz; 1830 to 1910 MHz; 2010 to 2070 MHz; DCS Rx filters; FBAR technology; GSM handsets; PCS Rx filters; die size; ladder topology; minimum rejection performance; thin film bulk acoustic resonator technology; wafer level packaging; Acoustic applications; Couplings; Distributed control; Film bulk acoustic resonators; GSM; Personal communication networks; Resonator filters; Telephone sets; Transistors; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2002. Proceedings. 2002 IEEE
ISSN :
1051-0117
Print_ISBN :
0-7803-7582-3
Type :
conf
DOI :
10.1109/ULTSYM.2002.1193547
Filename :
1193547
Link To Document :
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