DocumentCode :
393315
Title :
Studies by x-ray topography of the mass-loading effect on quartz and langasite resonator parameters
Author :
Mateescu, Irina ; Dumitrache, Liviu ; Capelle, Bernard ; Detaint, Jacques ; Johnson, Gary ; Borca, Elena ; Ranea, Constantin
Author_Institution :
Nat. Inst. of Mater. Phys., Bucharest, Romania
Volume :
1
fYear :
2002
fDate :
8-11 Oct. 2002
Firstpage :
957
Abstract :
In this paper the results of electrical measurements of the mass-loading influence on AT-cut quartz and Y-cut langasite resonators are compared with those obtained by X-ray topography analysis of the same resonators. The mass-loading effects on resonator characteristics have been studied using the Ballato´s transmission-line analogs of the trapped-energy resonators vibrating in thickness-shear mode. This study revealed that the mass-loading influence on electrical parameters of langasite resonators is smaller than in the case of quartz resonators. 5MHz Sawyer AT-cut quartz and Y-cut langasite resonators with Au electrodes, having various diameters and thicknesses were used in experiments. The results of the X-ray topography investigations are in agreement with the electrical measurements previously performed.
Keywords :
X-ray topography; crystal resonators; frequency control; gallium compounds; lanthanum compounds; quartz; 5 MHz; Ballato´s transmission-line analogs; LaGaO14; SiO2; X-ray topography; langasite resonator parameters; mass-loading effect; mass-loading influence; quartz resonator parameters; thickness-shear mode; trapped-energy resonators; x-ray topography; Electric variables measurement; Electrodes; Frequency; Gold; Inductance; Performance evaluation; Stress; Surfaces; Transmission lines; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2002. Proceedings. 2002 IEEE
ISSN :
1051-0117
Print_ISBN :
0-7803-7582-3
Type :
conf
DOI :
10.1109/ULTSYM.2002.1193554
Filename :
1193554
Link To Document :
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