DocumentCode :
393320
Title :
Measurement of the bulk acoustic wave propagation in ultrathin membranes
Author :
Profunser, Dieter M. ; Vollmann, Jacqueline ; Dual, Jürg
Author_Institution :
Center of Mech., Eidgenossische Tech. Hochschule, Zurich, Switzerland
Volume :
1
fYear :
2002
fDate :
8-11 Oct. 2002
Firstpage :
995
Abstract :
The measurement of bulk acoustic waves (BAW) excited in thin films or microstructures with ultrashort laser pulses is a powerful method for accurate and nondestructive evaluation of material or geometrical properties. Optical techniques like the pump-probe laser-based acoustic method generate BAW in a thermoelastic way by absorbing the pump laser pulses at the surface of the specimen. The acoustic waves are partly reflected at any discontinuity of the acoustic impedance. Back at the surface the reflected acoustic pulses cause changes of the optical reflection coefficient, which are measured with the probe laser pulses. The measurement technique is explained for the case of an aluminium thin film on sapphire. The influence of the film thickness and the deposition method of the thin films on the bulk wave speed is shown. In the second part of the paper this technique is used for measuring the bulk wave propagation in very thin membranes. The BAW propagation in freestanding silicon-nitride aluminium multilayer membranes with total thickness in the order of several hundred nanometers is measured. The measurements of the freestanding membranes are compared with measurements of the supported case. The technique presented in this paper can also be applied for the characterization of material or geometrical properties of thin film BAW resonators. The advantage of the method lies in its nondestructive and noncontact approach, which is necessary for ultrathin and brittle structures.
Keywords :
acoustic resonators; acoustic variables measurement; acoustic wave propagation; acoustic wave velocity; aluminium; bulk acoustic wave devices; membranes; metallic thin films; multilayers; nondestructive testing; sapphire; silicon compounds; Al; Al thin film; Al2O3; BAW measurement; SiN-Al; SiN-Al freestanding multilayer membranes; bulk acoustic wave propagation; bulk wave speed; film thickness; geometrical properties; material properties; nondestructive evaluation; sapphire substrate; thin film BAW resonators; ultrashort laser pulses; ultrathin membranes; Acoustic measurements; Acoustic propagation; Acoustic pulses; Acoustic waves; Biomembranes; Laser excitation; Optical pulses; Pulse measurements; Pump lasers; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2002. Proceedings. 2002 IEEE
ISSN :
1051-0117
Print_ISBN :
0-7803-7582-3
Type :
conf
DOI :
10.1109/ULTSYM.2002.1193563
Filename :
1193563
Link To Document :
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