DocumentCode :
393341
Title :
On the performance of compact thermal models of electronic chip packages in conjugate board level simulation
Author :
DeVoe, Jason ; Ortega, Alfonso ; Berhe, Mulugeta
Author_Institution :
Dept. of Aerosp. & Mech. Eng., Arizona Univ., Tucson, AZ, USA
fYear :
2003
fDate :
11-13 March 2003
Firstpage :
313
Lastpage :
318
Abstract :
This study seeks to introduce a true conjugate solution methodology for compact thermal models of electronic packages in board level simulations using a computational fluid dynamic (CFD)/computational heat transfer (CHT) approach. CTM models were created for a BGA and CPGA based on thermal response data obtained by applying a set of non-redundant boundary condition sets to a fully-detailed model of each package. For consistency, the data was generated using the computational fluid dynamics tool IcePak™ run in a non-conjugate mode. Smeared models of the JEDEC standard printed circuit board for each package were created within the conjugate environment. The conductivities of these boards were ranged between three orders of magnitude. The fully-detailed model of each package were evaluated on these boards and in an unmounted state. The air velocity was varied for each between 1.0, 2.5, and 5.0 [m/s]. The fully-detailed model was replaced with the derived CTM and tested under similar conditions. Secondary sources were also investigate on elongated PCBs. The location of the source on the board was varied between three locations upstream of the package. The resultant junction temperature prediction of each setup was then compared.
Keywords :
ball grid arrays; circuit simulation; computational fluid dynamics; heat transfer; integrated circuit modelling; printed circuits; thermal conductivity; thermal management (packaging); 1.0 m/s; 2.5 m/s; 5.0 m/s; BGA; CFD; CHT; CPGA; PCB thermal conductivity; air velocity; computational fluid dynamics; computational heat transfer; conjugate board level simulation; electronic chip package compact thermal models; elongated PCB; junction temperature prediction; nonredundant boundary condition sets; thermal response; Aerospace simulation; Boundary conditions; Computational fluid dynamics; Electronic packaging thermal management; Electronics packaging; Heat transfer; Solid modeling; Temperature; Testing; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2003. Ninteenth Annual IEEE
ISSN :
1065-2221
Print_ISBN :
0-7803-7793-1
Type :
conf
DOI :
10.1109/STHERM.2003.1194378
Filename :
1194378
Link To Document :
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