Title :
Logic verification based on diagnosis techniques
Author :
Veneris, Andreas ; Smith, Alexander ; Abadir, Magdy S.
Author_Institution :
Dept. ECE & CS, Toronto Univ., Ont., Canada
Abstract :
We present a formal logic verification methodology for combinational circuits. The method uses simulation, logic diagnosis and ATPG to identify circuit lines that implement equivalent logic functions efficiently. One advantage of the proposed technique is that it identifies line equivalences under controllability and observability don´t care conditions, while not suffering from false negatives. The method is easy to implement, and, due to its general nature, existing techniques can benefit from ideas described here. We also give implementation details and present experiments to confirm its potential.
Keywords :
automatic test pattern generation; circuit simulation; combinational circuits; controllability; equivalence classes; formal verification; integrated circuit design; logic design; logic simulation; observability; ATPG; combinational circuits; controllability don´t care conditions; diagnosis techniques; equivalent logic function circuit lines; false negatives; formal logic verification; line equivalence; logic diagnosis; logic simulation; observability don´t care conditions; Automatic test pattern generation; Boolean functions; Circuit simulation; Circuit synthesis; Combinational circuits; Controllability; Data structures; Logic circuits; Logic testing; Observability;
Conference_Titel :
Design Automation Conference, 2003. Proceedings of the ASP-DAC 2003. Asia and South Pacific
Print_ISBN :
0-7803-7659-5
DOI :
10.1109/ASPDAC.2003.1194999