DocumentCode
393409
Title
Calibration and characterization of 650 nm silicon narrow-band radiation thermometer
Author
Sakuma, F. ; Ma, L.
Author_Institution
Nat. Metrol. Inst. of Japan, AIST, Ibaraki, Japan
Volume
1
fYear
2002
fDate
5-7 Aug. 2002
Firstpage
53
Abstract
This paper describes the calibration and characterization of the 650 nm standard radiation thermometers used in the traceability system of radiation thermometers in Japan. NMIJ started in 2001 a new calibration service including the copper-point calibration. spectral responsivity and nonlinearity measurement. Characterization covers the size of source effect, distance effect, ambient temperature dependence, zero offset drift and long term stability.
Keywords
calibration; thermometers; 650 nm; ambient temperature dependence; calibration; copper-point calibration. spectral responsivity; distance effect; long-term stability; nonlinearity measurement; silicon narrow-band radiation thermometer; source effect; traceability system; zero offset drift; Calibration; Copper; Gold; Inspection; Length measurement; Metrology; Narrowband; Silicon; Silver; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
SICE 2002. Proceedings of the 41st SICE Annual Conference
Print_ISBN
0-7803-7631-5
Type
conf
DOI
10.1109/SICE.2002.1195181
Filename
1195181
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