Title :
Calibration and characterization of 650 nm silicon narrow-band radiation thermometer
Author :
Sakuma, F. ; Ma, L.
Author_Institution :
Nat. Metrol. Inst. of Japan, AIST, Ibaraki, Japan
Abstract :
This paper describes the calibration and characterization of the 650 nm standard radiation thermometers used in the traceability system of radiation thermometers in Japan. NMIJ started in 2001 a new calibration service including the copper-point calibration. spectral responsivity and nonlinearity measurement. Characterization covers the size of source effect, distance effect, ambient temperature dependence, zero offset drift and long term stability.
Keywords :
calibration; thermometers; 650 nm; ambient temperature dependence; calibration; copper-point calibration. spectral responsivity; distance effect; long-term stability; nonlinearity measurement; silicon narrow-band radiation thermometer; source effect; traceability system; zero offset drift; Calibration; Copper; Gold; Inspection; Length measurement; Metrology; Narrowband; Silicon; Silver; Temperature;
Conference_Titel :
SICE 2002. Proceedings of the 41st SICE Annual Conference
Print_ISBN :
0-7803-7631-5
DOI :
10.1109/SICE.2002.1195181
