DocumentCode :
39420
Title :
Algorithms for 3D Shape Scanning with a Depth Camera
Author :
Yan Cui ; Schuon, Sebastian ; Thrun, Sebastian ; Stricker, Didier ; Theobalt, Christian
Author_Institution :
Augmented Vision, German Res. Center for Artificial Intell., Kaiserslautern, Germany
Volume :
35
Issue :
5
fYear :
2013
fDate :
May-13
Firstpage :
1039
Lastpage :
1050
Abstract :
We describe a method for 3D object scanning by aligning depth scans that were taken from around an object with a Time-of-Flight (ToF) camera. These ToF cameras can measure depth scans at video rate. Due to comparably simple technology, they bear potential for economical production in big volumes. Our easy-to-use, cost-effective scanning solution, which is based on such a sensor, could make 3D scanning technology more accessible to everyday users. The algorithmic challenge we face is that the sensor´s level of random noise is substantial and there is a nontrivial systematic bias. In this paper, we show the surprising result that 3D scans of reasonable quality can also be obtained with a sensor of such low data quality. Established filtering and scan alignment techniques from the literature fail to achieve this goal. In contrast, our algorithm is based on a new combination of a 3D superresolution method with a probabilistic scan alignment approach that explicitly takes into account the sensor´s noise characteristics.
Keywords :
filtering theory; image resolution; probability; random noise; sensor fusion; solid modelling; video cameras; video signal processing; 3D object scanning; 3D scanning technology; 3D shape scanning; 3D superresolution method; ToF camera; data quality; depth camera; depth scans; economical production; established filtering techniques; nontrivial systematic bias; probabilistic scan alignment; random noise; scan alignment techniques; scanning solution; sensor noise characteristics; time-of-flight camera; video rate; Cameras; Image reconstruction; Image resolution; Noise; Shape; Solid modeling; Systematics; 3D scanning; Kinect; Superresolution; global alignment; nonrigid transformation; rigid transformation; time-of-flight;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2012.190
Filename :
6296662
Link To Document :
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