DocumentCode
394773
Title
A statistical simulation model for mobile radio fading channels
Author
Xiao, Chengshan ; Zheng, Yahong R.
Author_Institution
Dept. of Electr. & Comput. Eng., Missouri Univ., Columbia, MO, USA
Volume
1
fYear
2003
fDate
20-20 March 2003
Firstpage
144
Abstract
Recently, a Clarke´s model-based simulator was proposed for Rayleigh fading channels. However, that model, as shown in this paper, may encounter statistic deficiency. Therefore, an improved model is presented to remove the statistic deficiency. Furthermore, a new simulation model is proposed for Rician fading channels. This Rician fading simulator with finite number of sinusoids plus a zero-mean stochastic sinusoid as the specular (line-of-sight) component is different from all the existing Rician fading simulators, which have non-zero mean deterministic specular component. The statistical properties of the proposed Rayleigh and Rician fading channel models are analyzed in detail, which shows that these statistics either exactly match or quickly converge to the theoretically desired ones. Additionally and importantly, the probability density function of the Rician fading phase is not only independent from time but also uniformly distributed, which is fundamentally different from that of all the existing Rician fading models. The statistical properties of the new simulators are evaluated by numerical results, finding good agreement in all cases.
Keywords
Rayleigh channels; Rician channels; mobile radio; statistical analysis; Rayleigh fading channel; Rician fading channel; Rician fading simulator; channel simulators; mobile radio; nonzero-mean deterministic; probability density function; specular components; statistical simulation model; zero-mean stochastic sinusoid; Autocorrelation; Computational modeling; Computer vision; Fading; Land mobile radio; Mathematical model; Probability density function; Rayleigh channels; Rician channels; Statistics;
fLanguage
English
Publisher
ieee
Conference_Titel
Wireless Communications and Networking, 2003. WCNC 2003. 2003 IEEE
Conference_Location
New Orleans, LA, USA
ISSN
1525-3511
Print_ISBN
0-7803-7700-1
Type
conf
DOI
10.1109/WCNC.2003.1200335
Filename
1200335
Link To Document