DocumentCode :
39489
Title :
Micromagnetic Studies of Lateral TMR Memory Cell Driven by Spin Polarized Current or by Magnetic Field
Author :
Lei Xu ; Yi Wang ; Dan Wei ; Zhongshui Ma
Author_Institution :
Sch. of Phys., Peking Univ., Beijing, China
Volume :
49
Issue :
7
fYear :
2013
fDate :
Jul-13
Firstpage :
4421
Lastpage :
4424
Abstract :
The switching properties of an elliptical TMR memory cell Co70Fe30(PL1)/Ru/Co60Fe20B20(PL2)/MgO/Co60Fe20B20(FL), by magnetic field or by current, are studied with micromagnetic simulation. The switching characteristic of FL is understood by introducing reduced saturation magnetization at the edge of the elliptical trilayer structures. The polycrystalline microstructure is also important in the simulations. The uncompensated demagnetization field generated by the pinned layer can cause asymmetry to the R-H loop of magnetic field reversal case; and under certain conditions, it can lead to the symmetric switching current in the R-J loop for the spin polarized current reversal case. The reduced saturation magnetization at the edge and the separate treating of crystal grains and grain boundaries are essential factors in the good agreement between simulated and experimental R-H and R-J loops.
Keywords :
MRAM devices; boron alloys; cobalt alloys; demagnetisation; grain boundaries; iron alloys; magnesium compounds; magnetic hysteresis; magnetic switching; micromagnetics; ruthenium; spin polarised transport; tunnelling magnetoresistance; Co70Fe30-Ru-Co60Fe20B20-MgO-Co60Fe20B20; R-H loop; R-J loop; crystal grains; elliptical TMR memory cell; elliptical trilayer structure edge; grain boundaries; lateral TMR memory cell; magnetic field reversal; micromagnetic simulation; pinned layer; polycrystalline microstructure; reduced saturation magnetization; spin polarized current reversal; switching characteristic; switching properties; symmetric switching current; uncompensated demagnetization field; Demagnetization; Junctions; Magnetic multilayers; Magnetic tunneling; Saturation magnetization; Switches; Tunneling magnetoresistance; Hysteresis loop; TMR memory cell; memory cell edge; micromagnetic; spin transfer torque;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2013.2243901
Filename :
6559039
Link To Document :
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