DocumentCode
39489
Title
Micromagnetic Studies of Lateral TMR Memory Cell Driven by Spin Polarized Current or by Magnetic Field
Author
Lei Xu ; Yi Wang ; Dan Wei ; Zhongshui Ma
Author_Institution
Sch. of Phys., Peking Univ., Beijing, China
Volume
49
Issue
7
fYear
2013
fDate
Jul-13
Firstpage
4421
Lastpage
4424
Abstract
The switching properties of an elliptical TMR memory cell Co70Fe30(PL1)/Ru/Co60Fe20B20(PL2)/MgO/Co60Fe20B20(FL), by magnetic field or by current, are studied with micromagnetic simulation. The switching characteristic of FL is understood by introducing reduced saturation magnetization at the edge of the elliptical trilayer structures. The polycrystalline microstructure is also important in the simulations. The uncompensated demagnetization field generated by the pinned layer can cause asymmetry to the R-H loop of magnetic field reversal case; and under certain conditions, it can lead to the symmetric switching current in the R-J loop for the spin polarized current reversal case. The reduced saturation magnetization at the edge and the separate treating of crystal grains and grain boundaries are essential factors in the good agreement between simulated and experimental R-H and R-J loops.
Keywords
MRAM devices; boron alloys; cobalt alloys; demagnetisation; grain boundaries; iron alloys; magnesium compounds; magnetic hysteresis; magnetic switching; micromagnetics; ruthenium; spin polarised transport; tunnelling magnetoresistance; Co70Fe30-Ru-Co60Fe20B20-MgO-Co60Fe20B20; R-H loop; R-J loop; crystal grains; elliptical TMR memory cell; elliptical trilayer structure edge; grain boundaries; lateral TMR memory cell; magnetic field reversal; micromagnetic simulation; pinned layer; polycrystalline microstructure; reduced saturation magnetization; spin polarized current reversal; switching characteristic; switching properties; symmetric switching current; uncompensated demagnetization field; Demagnetization; Junctions; Magnetic multilayers; Magnetic tunneling; Saturation magnetization; Switches; Tunneling magnetoresistance; Hysteresis loop; TMR memory cell; memory cell edge; micromagnetic; spin transfer torque;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2013.2243901
Filename
6559039
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