• DocumentCode
    39489
  • Title

    Micromagnetic Studies of Lateral TMR Memory Cell Driven by Spin Polarized Current or by Magnetic Field

  • Author

    Lei Xu ; Yi Wang ; Dan Wei ; Zhongshui Ma

  • Author_Institution
    Sch. of Phys., Peking Univ., Beijing, China
  • Volume
    49
  • Issue
    7
  • fYear
    2013
  • fDate
    Jul-13
  • Firstpage
    4421
  • Lastpage
    4424
  • Abstract
    The switching properties of an elliptical TMR memory cell Co70Fe30(PL1)/Ru/Co60Fe20B20(PL2)/MgO/Co60Fe20B20(FL), by magnetic field or by current, are studied with micromagnetic simulation. The switching characteristic of FL is understood by introducing reduced saturation magnetization at the edge of the elliptical trilayer structures. The polycrystalline microstructure is also important in the simulations. The uncompensated demagnetization field generated by the pinned layer can cause asymmetry to the R-H loop of magnetic field reversal case; and under certain conditions, it can lead to the symmetric switching current in the R-J loop for the spin polarized current reversal case. The reduced saturation magnetization at the edge and the separate treating of crystal grains and grain boundaries are essential factors in the good agreement between simulated and experimental R-H and R-J loops.
  • Keywords
    MRAM devices; boron alloys; cobalt alloys; demagnetisation; grain boundaries; iron alloys; magnesium compounds; magnetic hysteresis; magnetic switching; micromagnetics; ruthenium; spin polarised transport; tunnelling magnetoresistance; Co70Fe30-Ru-Co60Fe20B20-MgO-Co60Fe20B20; R-H loop; R-J loop; crystal grains; elliptical TMR memory cell; elliptical trilayer structure edge; grain boundaries; lateral TMR memory cell; magnetic field reversal; micromagnetic simulation; pinned layer; polycrystalline microstructure; reduced saturation magnetization; spin polarized current reversal; switching characteristic; switching properties; symmetric switching current; uncompensated demagnetization field; Demagnetization; Junctions; Magnetic multilayers; Magnetic tunneling; Saturation magnetization; Switches; Tunneling magnetoresistance; Hysteresis loop; TMR memory cell; memory cell edge; micromagnetic; spin transfer torque;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2013.2243901
  • Filename
    6559039