DocumentCode

395027

Title

THCMOS: testable high speed CMOS design

Author

Rajsuman, R. ; Gupta, B.

Author_Institution

Case Western Reserve University

Volume

1

fYear

1989

fDate

1989

Firstpage

420

Lastpage

425

Keywords

CMOS technology; Circuit faults; Circuit testing; Current measurement; Electrical fault detection; FETs; Fault detection; Hardware; Logic testing; Robustness;

fLanguage

English

Publisher

ieee

Conference_Titel

Signals, Systems and Computers, 1989. Twenty-Third Asilomar Conference on

Print_ISBN

0-929029-30-1

Type

conf

DOI

10.1109/ACSSC.1989.1200825

Filename

1200825