DocumentCode :
3958
Title :
Circuit Analysis of Photosensitive Capacitance in Semi-Insulating GaAs
Author :
Boulais, Kevin A. ; Santiago, Fabian ; Wick, Peter L. ; Mejeur, J.M. ; Rayms-Keller, A. ; Lowry, Michael S. ; Long, Karen J. ; Sessions, Walter D.
Author_Institution :
Dahlgren Div., Naval Surface Warfare Center, Dahlgren, VA, USA
Volume :
60
Issue :
2
fYear :
2013
fDate :
Feb. 2013
Firstpage :
793
Lastpage :
798
Abstract :
We describe a circuit model for photosensitive capacitance in bulk semi-insulating GaAs toward tunable resonant applications. Capacitances from two separate regions are considered to interpret experimental results. A smaller valued capacitance exists between the depletion edges within the bulk material. Photodoping in this region progressively shorts out the bulk capacitance, leaving only the higher valued depletion capacitance. The depletion capacitance also increases with illumination, and numerical simulation is used to aid interpretation. Thus, the series combination of capacitance can be optically varied over orders of magnitude. Our results indicate that capacitance is nearly independent of applied voltage over a usable parameter space, making the concept attractive for linear application.
Keywords :
III-V semiconductors; capacitors; gallium arsenide; network analysis; GaAs; bulk capacitance; bulk material; bulk semiinsulating gallium arsenide; circuit analysis; circuit model; depletion capacitance; depletion edges; illumination; linear application; numerical simulation; photodoping; photosensitive capacitance; tunable resonant applications; Capacitance; Charge carrier processes; Density measurement; Gallium arsenide; Optical saturation; Optical sensors; Photonics; Capacitance; EL2; photosensitive; reactance; undoped semi-insulating GaAs (USI);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2012.2235070
Filename :
6407990
Link To Document :
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