• DocumentCode
    396273
  • Title

    Capacitance of abrupt one-sided InP/GaInAs heterojunctions

  • Author

    Sheinman, B. ; Sidorov, V. ; Ritter, D.

  • Author_Institution
    Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
  • fYear
    2003
  • fDate
    12-16 May 2003
  • Firstpage
    138
  • Lastpage
    141
  • Abstract
    We demonstrate theoretically and experimentally that abrupt one-sided N-p+ heterojunctions behave like majority carrier diodes, in spite of the accumulation of minority carrier charge. Therefore, the diffusion capacitance should not be included in their equivalent circuit. An important result is that the base-emitter junction capacitance of abrupt heterojunction bipolar transistors can be precisely measured at high forward bias. An additional conclusion is that Schottky diodes can be replaced by abrupt heterojunctions, which have superior noise performance, and lower leakage current.
  • Keywords
    III-V semiconductors; equivalent circuits; gallium arsenide; heterojunction bipolar transistors; indium compounds; leakage currents; minority carriers; semiconductor device noise; InP-GaInAs; abrupt heterojunction bipolar transistors; abrupt one-sided InP/GaInAs heterojunctions; base-emitter junction capacitance; diffusion capacitance; equivalent circuit; high forward bias; lower leakage current; majority carrier diodes; minority carrier charge accumulation; noise performance; Admittance; Capacitance; Circuits; Equations; Frequency; Heterojunctions; Indium phosphide; Schottky diodes; Semiconductor diodes; Thermionic emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 2003. International Conference on
  • Print_ISBN
    0-7803-7704-4
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2003.1205332
  • Filename
    1205332