DocumentCode
396273
Title
Capacitance of abrupt one-sided InP/GaInAs heterojunctions
Author
Sheinman, B. ; Sidorov, V. ; Ritter, D.
Author_Institution
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
fYear
2003
fDate
12-16 May 2003
Firstpage
138
Lastpage
141
Abstract
We demonstrate theoretically and experimentally that abrupt one-sided N-p+ heterojunctions behave like majority carrier diodes, in spite of the accumulation of minority carrier charge. Therefore, the diffusion capacitance should not be included in their equivalent circuit. An important result is that the base-emitter junction capacitance of abrupt heterojunction bipolar transistors can be precisely measured at high forward bias. An additional conclusion is that Schottky diodes can be replaced by abrupt heterojunctions, which have superior noise performance, and lower leakage current.
Keywords
III-V semiconductors; equivalent circuits; gallium arsenide; heterojunction bipolar transistors; indium compounds; leakage currents; minority carriers; semiconductor device noise; InP-GaInAs; abrupt heterojunction bipolar transistors; abrupt one-sided InP/GaInAs heterojunctions; base-emitter junction capacitance; diffusion capacitance; equivalent circuit; high forward bias; lower leakage current; majority carrier diodes; minority carrier charge accumulation; noise performance; Admittance; Capacitance; Circuits; Equations; Frequency; Heterojunctions; Indium phosphide; Schottky diodes; Semiconductor diodes; Thermionic emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 2003. International Conference on
Print_ISBN
0-7803-7704-4
Type
conf
DOI
10.1109/ICIPRM.2003.1205332
Filename
1205332
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