Title :
A DC current measurement circuit for on-chip applications
Author :
Tam, Clarence K L ; Roberts, Gordon W.
Author_Institution :
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, Que., Canada
Abstract :
A robust and highly scalable technique for measuring DC currents is described. The circuit consists largely of digital electronics except for a comparator and a passive RC filter. This simple structure is able to force a voltage at a circuit node while measuring the current that flows into it. The technique has been successfully demonstrated using a prototype constructed using a 0.35μm CMOS chip.
Keywords :
CMOS integrated circuits; electric current measurement; integrated circuit measurement; 0.35 micron; CMOS chip; DC current measurement circuit; comparator; digital electronics; on-chip applications; passive RC filter; Application software; Circuit testing; Current measurement; Feedback circuits; Force measurement; Integrated circuit testing; Prototypes; Pulse circuits; Pulse measurements; Voltage;
Conference_Titel :
Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
0-7803-7761-3
DOI :
10.1109/ISCAS.2003.1205510
