A self-testing method for the pipelined A/D converter

Author

Yoo, Jaeki ; Lee, Edward ; Swartzlander, Earl E., Jr.

Author_Institution

Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA

Volume

1

fYear

2003

fDate

25-28 May 2003

Abstract

This paper describes a new approach for Built-In Self-Test (BIST) of pipeline A/D converters that can measure the differential non-linearity (DNL) and integral non-linearity (INL) of the converter. This method utilizes a random input signal that is self generated by the pipeline A/D converter as the input stimulus for testing. Unlike the traditional ramp input or sinusoidal input histogram test, this method does not require any precise external input signal sources. It provides a low hardware cost solution for in-field verification since no extra precise analog circuits for signal generation are required. In addition, it is also possible to extend this concept to background self-testing.

Keywords

analogue-digital conversion; built-in self test; pipeline processing; built-in self-test; differential nonlinearity; histogram test; integral nonlinearity; pipeline A/D converter; random signal generation; Analog circuits; Automatic testing; Built-in self-test; Circuit testing; Costs; Equations; Hardware; Histograms; Pipelines; Signal generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on

Print_ISBN

0-7803-7761-3

Type

conf

DOI

10.1109/ISCAS.2003.1205512

Filename

1205512