An 8-bit 2-GSample/s analog-to-digital converter in 0.5-μm SiGe technology

Author

Vessal, Farhung ; Salama, C.A.T.

Author_Institution

Edward S. Rogers Sr. Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada

Volume

1

fYear

2003

fDate

25-28 May 2003

Abstract

This paper deals with the design and implementation of an 8-bit, 2-GSample/s folding-interpolating analog-to-digital converter using a 0.5-μm SiGe technology with a unity gain cut off frequency f_τ of 47 GHz. The high-speed, high-resolution A/D converter has applications in direct IF sampling receivers for wideband communication systems. The converter occupies an area of 3.5mm × 3.5 mm including pads and exhibits a better than 7-bit ENOB for an input signal frequency up to 500 MHz and a sampling rate of 2 GSample/s. The maximum value of DNL and INL are 0.6 and 1 Lsb respectively. The power dissipation of the ADC is 3.5 W using a 3.3 V power supply.

Keywords

Ge-Si alloys; analogue-digital conversion; bipolar integrated circuits; high-speed integrated circuits; interpolation; semiconductor materials; 0.5 micron; 3.3 V; 3.5 W; 47 GHz; 500 MHz; 8 bit; SiGe; SiGe HBT technology; direct IF sampling receiver; high-speed folding-interpolating analog-to-digital converter; unity gain cutoff frequency; wideband communication system; Analog-digital conversion; Circuits; Germanium silicon alloys; Interpolation; Linearity; Resistors; Signal resolution; Silicon germanium; Switches; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on

Print_ISBN

0-7803-7761-3

Type

conf

DOI

10.1109/ISCAS.2003.1205708

Filename

1205708