• DocumentCode
    39721
  • Title

    Cathode Spot Development on a Bulk Cathode in a Vacuum Arc

  • Author

    Beilis, Isak I.

  • Author_Institution
    Electrical Discharge and Plasma Laboratory, School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel
  • Volume
    41
  • Issue
    8
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    1979
  • Lastpage
    1986
  • Abstract
    A transient model of spot on a bulk cathode is developed, considering the initial adjacent plasma generated during arc triggering. A self-consistent approach is described and a closed mathematical solution is presented to understand the transient cathode phenomena and the time-dependent cathode potential drop (CPD), considering the kinetics and gas dynamics of the cathode plasma flow. The time-dependent spot development is calculated by considering different existing lifetimes \\tau of an initial plasma adjacent to the cathode for Cu, Cr, and W and 10-A spot current. The lifetime \\tau is in the range of 2–100 ns. The solution shows that for Cu, the cathode temperature increased from 3500 to 4300 K with spot time. The CPD decreased with spot time from initial values 100–45 V (depending on \\tau ) to 14–15 V at steady state. The solution for a refractory W cathode is obtained using a previously developed virtual cathode model. Calculation shows that a spot current density of {\\sim}{\\rm 10}^{7}~{\\rm A}/{\\rm cm}^{2} can support the spot initiation in a time of 2 ns considering W cathode vaporization with plasma generation by atom ionization. When \\tau increased from 2 ns to the 2 \\mu{\\rm s} range, the W cathode temperature decreased from {\\sim}{\\rm 10000}~{\\rm K} to a relatively low level of 7500 K.
  • Keywords
    Cathodes; Chromium; Copper; Heating; Ionization; Mathematical model; Vacuum arcs; Cathode potential drop (CPD); Cr; Cu; W; cathode spot; transient spot; vacuum arc;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2013.2256472
  • Filename
    6509911