DocumentCode :
397498
Title :
Matlab and COTS instrumentations to reduce time and risk factors in design to the stand-alone QAM test system
Author :
Tran, Lan H. ; Mai, Trang ; Molnar, Joseph A.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
fYear :
2003
fDate :
22-25 Sept. 2003
Firstpage :
490
Lastpage :
495
Abstract :
In this paper, we discuss how Matlab and standalone COTS instruments can be used to cut down the time to study the feasibility of a high speed digital communication test system. The result is a rack-and-stack QAM transceiver with the capability to characterize a device under test (DUT) in terms of bit error rate (BER) and error vector magnitude (EVM). Other characteristics of the DUT are also evaluated. The advantages of COTS rack-and-stack system are time reduction in development and return of capital investment, however, COTS stack-and-rack systems cannot cope with all aspects of high speed modern digital communications. Once the concept is proven, it will be transferred from rack-and-stack to a standalone test system which includes its own circuitry and embedded controller. The standalone digital communications test system is the ultimate goal of this study, since it provides the portability and speed required to support high speed modern digital communications. Advantages and disadvantage of stack-and-rack and standalone QAM test systems are presented.
Keywords :
digital communication; error statistics; quadrature amplitude modulation; telecommunication equipment testing; test equipment; transceivers; BER; COTS instrumentation; EVM; bit error rate; embedded controller; error vector magnitude; high speed digital communication test system; rack-and-stack QAM transceiver; stand-alone QAM test system; Bit error rate; Circuit testing; Communication system control; Control systems; Digital communication; Instruments; Investments; Quadrature amplitude modulation; System testing; Transceivers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
ISSN :
1080-7725
Print_ISBN :
0-7803-7837-7
Type :
conf
DOI :
10.1109/AUTEST.2003.1243621
Filename :
1243621
Link To Document :
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