DocumentCode
398349
Title
Image multithresholding based on sample moment function
Author
Sezgin, Mehmet ; Sankur, Bulent
Author_Institution
Inf. Technol. Res. Inst., Tubitak Marmara Res. Center, Kocaeli, Turkey
Volume
2
fYear
2003
fDate
14-17 Sept. 2003
Abstract
A new multilevel thresholding method is proposed using sample moment function (SMF). For the binary case the method can make use of the a priori information on whether the target object is found on the darker or lighter part of the scene. Extensive comparisons using a database of NDT images show that the proposed method outperforms in competition 40 other thresholding methods from the literature M. Sezgin et al. (2001) (2003), based upon both objective scores and subjective evaluation.
Keywords
image segmentation; method of moments; nondestructive testing; visual databases; NDT images database; multilevel image thresholding method; sample moment function; target object; Histograms; Image databases; Image segmentation; Information technology; Layout; Nondestructive testing; Pixel; Reflectivity; Shape measurement; Surface texture;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing, 2003. ICIP 2003. Proceedings. 2003 International Conference on
ISSN
1522-4880
Print_ISBN
0-7803-7750-8
Type
conf
DOI
10.1109/ICIP.2003.1246705
Filename
1246705
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