AM and SEEM techniques in magnet wire manufacturing

Author

Garza-Garcia, René ; Solis-Rodriguez, J. ; Peña-Rojas, Sergio ; de CV Magnekon, S.A.

fYear

2003

fDate

23-25 Sept. 2003

Firstpage

97

Lastpage

100

Abstract

Copper and enamel are, by far, the main components of magnet wire. Both materials come together by means of the enameling process and form a composite with a wide range of applications in bobbins, motors, transformers and so forth. The copper and enamel characterization by traditional techniques based on their physical properties seems not to be enough to forecast the behavior of both materials in the process of magnet wire manufacturing. This paper addresses the use of the Atomic Force Microscope (AM) and the Scanning Electron Microscope (SEEM) in the analysis of copper and enamel respectively.

Keywords

atomic force microscopy; coating techniques; copper; insulated wires; scanning electron microscopy; wire drawing; AM techniques; Cu; SEEM techniques; atomic force microscope; bobbins; copper wire; enameling process; magnet wire manufacturing; motors; scanning electron microscope; transformers; Atomic force microscopy; Composite materials; Copper; Magnetic analysis; Magnetic materials; Magnetic properties; Manufacturing processes; Scanning electron microscopy; Transformers; Wire;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation Conference and Electrical Manufacturing & Coil Winding Technology Conference, 2003. Proceedings

ISSN

0362-2479

Print_ISBN

0-7803-7935-7

Type

conf

DOI

10.1109/EICEMC.2003.1247862

Filename

1247862